UCSC Library Search for 'Provider:NEW YORK ; JOHN WILEY'

3-TIER CLIENT/SERVER AT WORK

By EDWARDS J.:. NEW YORK : JOHN WILEY 1999 . 305 p. 0000471315028

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The 80386/387 architecture

By MORSE, Stephen P : Isaacson, Eric J. : ALBERT, Douglas J. New York : John Wiley 1987 . 324 p. 0000471853526

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Advanced programming techniques : a second course in programming using fortran

By HUGHES, Charles E :PFLEEGER, Charles P: ROSE, Lawrence L. New York : John Wiley 1978 . 287 p. 0000471026115

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ADVANCED TECHNIQUES FOR JAVA DEVELOPERS : FULLY COVERS THE JAVA 2 PLATFORM :( With CD)

By BERG D.J. & FRITZINGER J.S.. NEW YORK : JOHN WILEY 1999 . 511 p. 0000471327182

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AI AGENT IN VIRTUAL REALITY WORLDS:PROGRAMMING INTELLIGENT VR IN C++ :( With CD)

By WATSON M.. NEW YORK : JOHN WILEY 1996 . 309 p. 0000471127086

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ALL ABOUT NETWORK DIRECTORIES : UNDERSTANDING DIRECTORY SERVICES AND BUSINESS APPLICATIONS

By KAMPMAN K & KAMPMAN C. NEW YORK : JOHN WILEY . 249 p. 0000471333638

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Analysis of Ordinal Categorical Data

By AGRESTI, ALAN. New York, John Wiley 1984 . 287 p. 0000471890553

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The analysis of variance

By SCHEFFE, Henry. New York, John Wiley 1959 . 477 p. 0000471758345

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Anti Patterns: Refactoring Software,Architectures,and Projects in Crisis

By BROWN,WILLIAM J. [et al.]. New York: John Wiley & Sons,Inc. 1998 . 309 p. 9780471197133

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APL :an interactive approach

By GILMAN, L : ROSE, A.J.. New York : John Wiley 1976 . 378 p. 0000471300225

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Applications of statistics to industrial experimentation

By DANIEL, Cuthbert. New York : John Wiley 1976 . 294 p. 0000471194697

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APPLIED DISCRIMINANT ANALYSIS

By HUBERTY, C.J.. NEW YORK : JOHN WILEY 1994 . 466 p. 0000471311456

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APPLIED LOGISTIC REGRESSION

By HOSMER, D.W. & LEMESHOW, S.. NEW YORK : JOHN WILEY 2000 . 375 p. 0000471356328

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Applied Logistic Regression

By HOSMER, David W. & LEMESHOW, S. New York : John Wiley 1989 . 307 p. 0000471615536

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Applied regression analysis

By DRAPER,N.R. : SIMITH,H.. New York : John wiley 1981 . 709 p. 0000471029955

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Applied regression analysis

By DRAPER, N.R. , SMITH, H.. New York , John Wiley 1966 . 407 p. 0000471221708

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Applied regression analysis

By DRAPER, N.R.. New York : John Wiley 1966 . 407 p. 0000171221701

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Applied statistics : analysis of variance and regression

By DUNN, Olive Jean,: CLARD, Virginia. New York , John Wiley 1974 . 387 p. 0000471227005

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